RF Bluetooth LNA Test Cost Reduction for Catastrophic and Parametric Faults
Ayari Nadia1, Hamdi Belgacem2

1Ayari Nadia, Department of Electronic & Microelectronics’ LAB. Monastir, Tunisia.
2Belgacem Hamdi, Department of Electronic & Microelectronics’ LAB. Monastir Tunisia.

Manuscript received on May 02, 2013. | Revised Manuscript Received on May 11, 2013. | Manuscript published on May 20, 2013. | PP: 112-116 | Volume-1, Issue-6, May 2013. | Retrieval Number: F0288041613/2013©BEIESP
Open Access | Ethics and Policies | Cite
© The Authors. Published By: Blue Eyes Intelligence Engineering and Sciences Publication (BEIESP). This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/)

Abstract: Radio Frequency and Analog circuit are often tested based on their performances. In this paper we investigate the test of RF Bluetooth LNA design for catastrophic and parametric fault model. The proposed technique is based on the measurement of S-parameters, Noise Figure, factor of stability, third-order intercept (IIP3) and the current consumption. The purpose of this study is reducing the test sets while keeping high fault coverage. The efficiency of this technique is proved by fault injection on the LNA circuit, measurement of parameters and analysis of fault coverage in each case. This study shows that we obtain acceptable fault coverage with reduced set of parameters. Two parameters are sufficient for parametric faults to get 98.7% fault coverage. For catastrophic fault we obtain 100% fault coverage with only three parameters. 
Keywords: LNA, Noise Figure, IIP3, factor of stability, S parameters, test, fault coverage.