Automated Measurement of Dielectric Constant at Microwave Frequencies
Dushyant Bansal, Babu Shivnath Agrawal College of Engineering & Technology, Mathura, India.
Manuscript Received on July 04, 2015. | Revised Manuscript Received on July 14, 2015. | Manuscript published on July 20, 2015. | PP: 26-29 | Volume-3 Issue-8, July 2015. | Retrieval Number: H0648073815/2015©BEIESP
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© The Authors. Blue Eyes Intelligence Engineering and Sciences Publication (BEIESP). This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/)
Abstract: Techniques based on the perturbation of cavity resonators are commonly used to measure the permittivity and loss tangent of samples of dielectric and ferrite materials at microwave frequencies. This paper presents an automated cavity perturbation technique at X-band using VNA and LabVIEW software. Being an automated procedure, the method is repeatable and avoids any uncertainties of manual measurements. The computer algorithm for automation of data acquisition and the overall experimental setup is presented. This paper overcome the assumptions error made in the theory of these techniques and provides estimates of the errors of measurement arising from them. And implement an empirical formula based on practical experiments to correct the relative difference.
Keywords: Cavity perturbation, Dielectric constant, loss tangent, LabVIEW.